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DETERMINING TITANIUM CONTENT IN FERROMANGANESE-SILICON BY X-RAY FLUORESCENCE SPECTRUM ANALYSIS METHOD
Author(s): 
Pages: 42-44
Year: Issue:  4
Journal: FERRO-ALLOYS

Keyword:  锰硅合金光谱分析质量分数;
Abstract: 将一定粒度的粉末试样压制成片状试料后,用VXQ-150A X射线荧光光谱仪进行测试分析,在真空介质中,试片经激发源产生的X射线的X光管照射后,发射出元素组成的特征谱线,分光晶体按照布拉格衍射定律将特征谱线分解成所需要的分析线,分析线的积分强度与含量成正比.
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