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The effect of wet end condition on the physical property of corrgated basepaper
Author(s): 
Pages: 19-20
Year: Issue:  3
Journal: HUNAN PAPERMAKING

Keyword:  Zeta电位瓦楞原纸物理性能;
Abstract: 研究了pH值和CPAM的加入量对浆料Zeta电位以及瓦楞原纸物理性能的影响.结果表明:随着浆料pH值的下降,Zeta电位负值逐渐变小,瓦楞原纸的裂断长和环压指数呈现先增大再减小的趋势;在Zeta电位为-12.4mv时,裂断长及环压指数达到最大值.随着CPAM加入量的增加,浆料Zeta电位不断提高,裂断长呈现上升趋势,而环压指数则呈现先下降后上升趋势.
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