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Emissivity Measurement of Materials by Infrared Thermography
Author(s): 
Pages: 14-17+39
Year: Issue:  1
Journal: Optoelectronic Technology

Keyword:  比辐射率测量材料热象红外测温辐射度学测量原理黑体辐射被测样品重要参量计算公式;
Abstract: Emissivity is an important parameter in radiometry. In this paper, two methods for surface emissivity measurement using IR thermovision are discussed, and are advocated by the experimental results. Measurement principles are analysed, and calculating expressions are deduced.
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