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On the Testing of Spectrum Sensitivity of Photoelectric Devices
Author(s): 
Pages: 33-37
Year: Issue:  2
Journal: Optoelectronic Technology

Keyword:  光谱灵敏度测试方法光谱响应光电器件测试装置光电转换光路设计被测器件输出方式球面反射镜;
Abstract: A spectrum sensitivity measuring method and the testing principleof photoelectric devices are discussed.Emphasis is put upon the sele-tion of optical-mechanical system and testing scheme,the collectionof weak signal,the data processing and output.The curves of spectrumresponse and the data of relative sensitivity may be obtained by thetesting set.This testing set measuring method may be applied to vari-ous photoelectric devices in the region of 380—800nm.
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