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Sulfuration mechanism and failure analysis of chip resistors
Author(s): 
Pages: 107-109
Year: Issue:  3
Journal: Household Appliance Technology

Keyword:  片式电阻硫化失效分析;
Abstract: 针对片式电阻阻值异常问题,采用能谱分析和扫描电镜等手段进行分析,确认是由于片式电阻焊盘处出现硫化现象导致阻值异常,进一步研究了片式电阻硫化机理,并提出了预防电阻硫化的措施.
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